Contents

 
• List of Figures
• Introduction
• Parameter variations
  • Element matching
  • Local process variations
  • Global process variations
  • Process gradients
  • Boundary effects
• The small-signal equivalent diagram of the MOS transistor
  • Low frequency model (saturation)
  • Low frequency model (linear region).
  • Capacitances of the small-signal equivalent diagram
  • Summary and typical values
• MOS current mirrors
  • Low frequency analysis disregarding channel length modulation
  • Current mirror with channel length modulation
  • Small signal analysis of the MOS current mirror
  • Cascode current mirrors
  • Relative parameter variations in MOS current mirrors
• MOS differential pairs
  • Large signal analysis of MOS differential pairs
  • Distortion of MOS differential pairs
  • Offset in MOS differential pairs
• Noise coupling
  • Power supply coupling
  • Substrate noise coupling
  • Signal noise coupling
• Conclusion
• References
• About this document ...