Lectures 4 through 6:
CMOS logic performance estimation
Lecture 4:
CMOS delay
- Purpose:
How to estimate CMOS logic gate delay and
to dimension a multi-stage network
- Contents:
- RC delay models and
Elmore delay model
Logical and electrical effort and
parasitic delay
2nd-order effects
CMOS inverter propagation delay
CMOS gate delay and multi-stage logic networks
- Literature:
- Weste & Harris sections 4.1 - 4.3
- Supplementary reading:
- J.M. Rabaey, A. Chandrakasan and B. Nikolic:
Digital Integrated Circuits - A Design Perspective,
2nd edition, Prentice Hall, 2003,
Section 6.2
Lecture 5:
Resistance, capacitance and wire models
- Purpose:
To describe how to estimate internal parasitics
- Contents:
- MOS transistor intrinsic:
overlap, channel, diode capacitances
Wiring:
substrate, inter-wiring capacitances
Miller effect
Sheet resistances
Transistor-'ON', diffusion, contact, wire
resistances
Wire delay:
Lumped-RC, distributed-RC models
Elmore delay model
- Literature:
- Weste & Harris sections 4.5 - 4.6
Design Rules for a 90 nm CMOS process
- Supplementary reading:
- J.M. Rabaey, A. Chandrakasan and B. Nikolic:
Digital Integrated Circuits - A Design Perspective,
2nd edition, Prentice Hall, 2003,
Sections 3.3.2 - 3.3.4, 4.1 - 4.4, 5.4
Lecture 6:
Power consumption, technology scaling and process variations
- Purpose:
To estimate the power consumption of the CMOS inverter
- Contents:
- Activity-related and short-circuit
dynamic power consumption
Static power consumption:
leakage currents, sub-treshold losses
Design margin
Reliability
Technology scaling
- Literature:
- Weste & Harris sections 4.4, 4.7 - 4.9
- Supplementary reading:
- J.M. Rabaey, A. Chandrakasan and B. Nikolic:
Digital Integrated Circuits - A Design Perspective,
2nd edition, Prentice Hall, 2003,
Sections 5.5
Keith Sabine:
A methodology for minimizing leakage current,
EEdesign, CMP Media, October 2003