The Huber concept in device modeling, circuit diagnosis and design centering

John W. Bandler, Radek M. Biernacki, Steve H. Chen, Ron H. Hemmers, Kaj Madsen

Keywordsrobust estimation, engineering design
TypeConference paper [With referee]
ConferenceIEEE Int. Symp. Circuits and Systems
Year1994    pp. 129-132
BibTeX data [bibtex]
IMM Group(s)Scientific Computing