@ARTICLE\{IMM1996-02690,
    author       = "C. K. Hansen and P. Thyregod",
    title        = "Modelling and Estimation of  Wafer Yields and Defect Densities from Microelectronic Test Structure Data",
    year         = "1996",
    pages        = "9-17",
    journal      = "Quality and Reliability International",
    volume       = "12",
    editor       = "",
    number       = "",
    publisher    = "",
    url          = "http://www2.compute.dtu.dk/pubdb/pubs/2690-full.html"
}