@ARTICLE\{IMM2010-05927,
    author       = "P. S. J{\o}rgensen and K. V. Hansen and R. Larsen and J. R. Bowen",
    title        = "High accuracy interface characterization of three phase material systems in three",
    year         = "2010",
    keywords     = "Interface characterization, Triple phase boundary, Surface area, Solid oxide fuel cells",
    pages        = "8168-8176",
    journal      = "Journal of Power Sources",
    volume       = "195",
    editor       = "",
    number       = "",
    publisher    = "Elsevier",
    url          = "http://www2.compute.dtu.dk/pubdb/pubs/5927-full.html",
    abstract     = "Quantification of interface properties such as two phase boundary area and triple phase boundary length
is important in the characterization ofmanymaterial microstructures, in particular for solid oxide fuel cell
electrodes. Three-dimensional images of these microstructures can be obtained by tomography schemes
such as focused ion beam serial sectioning or micro-computed tomography. We present a high accuracy
method of calculating two phase surface areas and triple phase length of triple phase systems from subvoxel
accuracy segmentations of constituent phases. The method performs a three phase polygonization
of the interface boundaries which results in a non-manifold mesh of connected faces. We show how the
triple phase boundaries can be extracted as connected curve loops without branches. The accuracy of the
method is analyzed by calculations on geometrical primitives."
}