Modeling the hysteresis of a scanning probe microscope |
|
| Type | Journal paper [With referee] |
| Journal | Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures |
| Year | 2000 Vol. 18 No. 2 pp. 621-625 |
| BibTeX data | [bibtex] |
| IMM Group(s) | Mathematical Physics |